SRC/SEMATECH Engineering Research Center for Environmentally Benign Semiconductor Manufacturing

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Home : Research
ERC Research:

Research Strategy and Organization

lab1.jpg (84847 bytes) Environmental factors are often not included in the design and development of new tools and processes in the semiconductor industry. Integrating Design For the Environment into new processes and tools for the industry is the technical driver and the common theme of the Center’s research.  The Center’s interdisciplinary research efforts involve 14 universities and 11 different academic disciplines.

The semiconductor industry is a very fast-moving industry, one which creates many opportunities for innovation and implementation of changes. The fast pace also presents a major challenge in planning and conducting long-term research. One challenge is to strike the right balance between long-term development, short-term relevance, and application to the present problems. The Center’s research strategy is to maintain this balance and promote a mix of projects and activities ranging from high-risk, high-payoff research to smaller projects with more immediate applications.

Originally organized in thrusts built around semiconductor manufacturing processes: Thrust A (Back-End Processes), Thrust B (Front-End), Thrust C (Factory Integration), and Thrust D (Patterning), the Center's current SRC/SEMATECH core research projects, as well as non-core projects, are listed below.


ERC ANNUAL REPORTS

(Pages #s listed in directories are PDF-assigned page #s)
Reports and review presentations & posters are password protected, privileged information for members only and are not for distribution.  If you questions regarding the annual report/review information, contact Karen McClure at (kmcclure@erc.arizona.edu). 
ERC research information can also be accessed via the SRC website http://www.src.org; available to SRC members only.
Directory 2010; Report 2010
Directory 2009; Report 2009
Directory 2008; Report 2008
Directory 2007; Report 2007
Directory 2006; Report 2006
Directory 2005; Report 2005
Directory 2004; Report 2004
Directory 2003; Report 2003
Directory 2002; Report 2002
Directory 2001; Report 2001
Directory 2000; Report 2000

 

CURRENT CORE ERC PROJECTS
425.023

Environmental Safety and Health (ESH) Impacts of Emerging Nanoparticles and Byproducts from Semiconductor Manufacturing-Preparation and Characterization of Nanoparticles
Faculty participants:  Farhang Shadman, University of Arizona; Reyes Sierra, University of Arizona; Jim Field, University of Arizona; Scott Boitano, University of Arizona; Buddy Ratner, University of Washington

425.024

Environmental Safety and Health (ESH) Impacts of Emerging Nanoparticles and Byproducts from Semiconductor Manufacturing-Toxicity Assessment and Prediction
Faculty participants: Farhang Shadman, University of Arizona; Reyes Sierra, University of Arizona; Jim Field, University of Arizona; Scott Boitano, University of Arizona; Buddy Ratner, University of Washington

425.025

Development of Quantitative Structure-Activity Relationship for Prediction of Biological Effects of Nanoparticles Associated with Semiconductor Industries
Faculty participants:
Yongsheng Chen, Arizona State University/Georgia Institute of Technology; Jonathan Posner, Arizona State University; Trevor Thornton, Arizona State University 

425.026

Low-ESH-Impact Gate Stack Fabrication by Selective Surface Chemistry
Faculty participants: Anthony Muscat, University of Arizona

425.027 Predicting, Testing, and Neutralizing Nanoparticle Toxicity
Faculty participants
Steven Nielsen, University of Texas-Dallas; Rockford Draper, University of Texas-Dallas; Paul Pantano, University of Texas-Dallas; Inga Musselman, University of Texas -Dallas; Gregg Dieckmann, University of Texas-Dallas; Ara Philipossian, University of Arizona
425.028 Lowering the Environmental Impact of High-k and Metal Gate-Stack Surface Preparation Processes
Faculty participants:
Yoshio Nishi, Stanford University; Srini Raghavan, University of Arizona; Farhang Shadman, University of Arizona; Bert Vermeire, Arizona State University
425.029

Sugar-Based Photoacid Generators ("Sweet" PAGs): Environmentally Friendly Materials for Next Generation Photolithography
Faculty participants
Christopher Ober, Cornell University; Reyes Sierra, University of Arizona

425.030   & 425.031

Supercritical Carbon Dioxide Compatible Additives: Design, Synthesis, and Application of an Environmentally Friendly Development Process to Next Generation Lithography-Resists and Additives
Faculty participants:
Juan de Pablo, University of Wisconsin ; Christopher Ober, Cornell University; James Watkins, University of Massachusetts

425.032

Fundamentals of Advanced Planarization: Pad Micro-Texture, Pad Conditioning, Slurry Flow, and Retaining Ring Geometry
Faculty participants:
Ara Philipossian, University of Arizona; Duane Boning, Massachusetts Institute of Technology

425.033

Development of an All-Wet Benign Process Based on Catalyzed Hydrogen Peroxide (CHP) Chemical System for Stripping of Implanted State-of-the-Art Deep UV Resists
Faculty participants: Srini Raghavan, University of Arizona

425.034

Improvement of ESH Impact of Back End of Line (BEOL) Cleaning Formulations Using Ionic Liquids to Replace Traditional Solvents
Faculty participants: Srini Raghavan, University of Arizona

425.035

High-Throughput Cellular-Based Toxicity Assays for Manufactured Nanoparticles and Nanostructure-Toxicity Relationship Models
Faculty participants:
Alex Tropsha, University of North Carolina-Chapel Hill; Russell Mumper, University of North Carolina-Chapel Hill; Denis Fourches, University of North Carolina-Chapel Hill

 

NO COST EXTENSION:

Non-PFOS/Non-PFAS Photoacid Generators: Environmentally Friendly Candidates for Next Generation Lithography (425.012: Ober, Cornell University)

Novel Methods for Destruction of PFOS in Semiconductor Process Waters Using Boron-Doped Diamond Film Electrodes  (425.018: Farrell & Sierra, University of Arizona)
Low Environmental-Impact Processing of sub-50 nm Interconnect Structures (425.017: Watkins, University of Massachusetts)
Environmentally Benign Electrochemically Assisted Chemical Mechanical Planarization (425.016: West, Columbia University; Raghavan, University of Arizona)
 

CUSTOMIZED ERC RESEARCH PROJECTS

Nano-Manufacturing of S/C Devices by Biologically-Inspired Processes
A.Muscat, M.McEvoy, M.Mansuripur, University of Arizona (Co-sponsored by Science Foundation Arizona, ASM, SEZ, Arizona TRIF Initiative)
Electro-Coagulation Applied to Water Conservation & Wastewater Treatment
J.Baygents, J.Farrell, University of Arizona (Co-sponsored by WSP and Intel)
Effect of Polisher Kinematics in Reducing Average Shear Force and Increasing Removal Rate in Copper CMP
A Philipossian, University of Arizona; D.Boning, Massachusetts Institute of Technology (Sponsored by Hitachi Chemical)
Impact of Fluoride and Copper in Wastewater on Publicly-Owned Treatment Works
R.Sierra, University of Arizona (Sponsored by Sematech)
A Survey of Water Use, Reuse, and Policies Affecting Semiconductor Industry in Semi-Arid Areas
S.Megdal, WRRC-University of Arizona (Sponsored by Arizona TRIF Initiative)
Reducing Water and Chemical Usage in Large Wafer (450mm) Single-Wafer Processing Tools
B.Vermeire, Arizona State University (Sponsored by EMC)
EHS Assessment of Chelators and Biocides Utilized in Semiconductor Manufacturing
R.Sierra, University of Arizona (Sponsored by Sematech)
Low-Energy-Hybrid Technology for Ultra-Purification and Recycling of Water
F.Shadman, University of Arizona (Sponsored by ERC, Pall Corp, and Arizona TRIF Initiative)
Fate of CMP Nano-Particles in Typical Wastewater Treatment Systems
R.Sierra, University of Arizona (Suggested by ISMI; jointly planned and initiated by ISMI/ERC)

CUSTOMIZED PROGRAM ON HIGH-VOLUME NANO-MANUFACTURING (HVnM)
(Initiated and currently sponsored by Intel)

Lowering Slurry Use and Waste in CMP Processes: Investigation of the Relationship between Planarization & Pad Surface Micro-Topography
A. Philipossian, University of Arizona
Lowering Waste in CMP Processes: Retaining Ring and Conditioner Interactions
A. Philipossian, University of Arizona
Contamination Control in Gas Distribution Systems for Semiconductor Fabs
F. Shadman, University of Arizona
Develop an AFM-Based Methodology to Optimize APM Composition for Removing Particles from Surfaces
S.Raghavan, University of Arizona
Integrated Electrochemical Treatment of CMP Waste Streams for Water Reclaim and Conservation
J.Baygents, J.Farrell, University of Arizona
 

ERC ANNUAL REPORTS

(Pages #s listed in directories are PDF-assigned page #s)
Reports and review presentations & posters are password protected, privileged information for members only and are not for distribution.  If you questions regarding the annual report/review information, contact Karen McClure at (kmcclure@erc.arizona.edu).  ERC research information can also be accessed via the SRC website http://www.src.org; available to SRC members only.
 
Directory 2010; Report 2010
Directory 2009; Report 2009
Directory 2008; Report 2008
Directory 2007; Report 2007
Directory 2006; Report 2006
Directory 2005; Report 2005
Directory 2004; Report 2004
Directory 2003; Report 2003
Directory 2002; Report 2002
Directory 2001; Report 2001
Directory 2000; Report 2000

 

ERC INTERIM REPORTS - CORE FUNDING - CURRENT

(TO BE POSTED)
425.023:

425.024:
425.025:
425.026:
425.027:
425.028:
425.029:
425.030:
425.031:
425.032:
425.033:
425.034:
425.035:

 

ERC INTERIM REPORTS - CORE FUNDING - 2007-2008

425.012:  CMOS Biochip for Rapid Assessment of New Chemicals [2007: March 1]
425.013:  Non-PFOS/Non-PFAS Photoacid Generators: Environmentally Friendly Candidates for Next Generation Lithography [2008: May 1]   [2007Dec.1] [2009: Feb.1]
425.014:  Environmentally Benign Electrochemically Assisted Chemical Mechanical Planarization (E-CMP)  [2008: March 1; Sept.2]  [2007: Dec.1]
425.015:  Reductive Dehalogenation of Perfluoroalkyl Surfactants in Semiconductor Effluents [2008: June 1; June 2)  [2007: June 1; June 2]
425.016:  EHS Impact of Electrochemical Planarization Technologies [2008: June 1] [2007: Sept.1; Dec.2]
425.017:  Environmentally Benign Vapor Phase and Supercritical CO(2) Processes for Patterned Low k Dielectrics [2008: March 1; March 2; March 3]  [2007: March 1; March 2; March 3]
425.018
Destruction of Perfluoroalkyl Surfactants in Semiconductor Process Waters using Boron Doped Diamond Film Electrodes [2008: June 1; June 2; June 3]  [2007: June 1; June 2; June 3; Dec.4]
425.019:  Low Environmental Impact Processing of sub-50 nm Interconnect Structures [2008: May 1]  [2007: Feb.1March 2]
425.020:  An Integrated, Multi-Scale Framework for Designing Environmentally-Benign Copper, Tantalum and Ruthenium Planarization Processes [2008: March 1, Aug. 2, Sept. 3]  [2007: Aug. 1]
425.021:  Low-Water and Low-Energy Rinsing and Drying of Patterned Wafers, Nano-Structures, and New Materials Surfaces [2008: June 1[2007: June 1, Dec. 2]
425.022:  Environmentally-Friendly Cleaning of New Materials and Structures for Future Micro- and Nano-Electronics Manufacturing [2008: March 1, March 2, Sept. 3]  [2007: March 1]

 

ANNUAL ERC REVIEW PRESENTATIONS  

2010;  2009; 2008; 2007; 2006; 2005 2004; 2003; 2002; 2001; 2000

 

ANNUAL REVIEW POSTERS

2009; 2008; 2007; 2006; 2005 2004; 2003; 2002; 2001; 2000